ComputerSurge/bind9
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Revert "Kill unit tests that run more than 1200 seconds"

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This reverts commit 6cdeb5b046 which added
wrapper around all the unit tests that would run the unit test in the
forked process.

This makes any debugging of the unit tests too hard. Futures attempts to
fix #3980 (closed) should add a custom automake test harness (log
driver) that would kill the unit test after configured timeout.
This commit is contained in:
Ondřej Surý
2023-04-14 06:20:48 +02:00
parent a901bf893f
commit f7bdab0591
2 changed files with 14 additions and 45 deletions
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6
lib/isc/include/isc/util.h
View File

@@ -59,12 +59,6 @@
*/
#define UNUSED(x) (void)(x)
#if __has_c_attribute(maybe_unused)
#define ISC_ATTR_UNUSED [[maybe_unused]]
#else
#define ISC_ATTR_UNUSED __attribute__((__unused__))
#endif
#if __GNUC__ >= 8 && !defined(__clang__)
#define ISC_NONSTRING __attribute__((nonstring))
#else /* if __GNUC__ >= 8 && !defined(__clang__) */

53
tests/include/tests/isc.h
View File

@@ -17,7 +17,6 @@
#include <inttypes.h>
#include <stdbool.h>
#include <unistd.h>
#include <uv.h>
#include <isc/buffer.h>
@@ -36,9 +35,6 @@
#include "task_p.h"
#include "timer_p.h"
#include <sys/types.h>
#include <sys/wait.h>
#define CHECK(r) \
do { \
result = (r); \
@@ -106,39 +102,18 @@ teardown_managers(void **state);
#define ISC_TEST_MAIN ISC_TEST_MAIN_CUSTOM(NULL, NULL)
#define ISC_TEST_MAIN_CUSTOM(setup, teardown) \
static int __child = 0; \
static void __alarm(int sig ISC_ATTR_UNUSED) { \
kill(__child, SIGABRT); \
} \
int main(void) { \
int r, status; \
\
switch ((__child = fork())) { \
case 0: \
break; \
case -1: \
exit(1); \
default: \
signal(SIGALRM, __alarm); \
alarm(1200); \
if ((r = waitpid(__child, &status, 0)) == __child) { \
/* Pass the exit status to the caller. */ \
if (WIFEXITED(status)) { \
exit(WEXITSTATUS(status)); \
} \
} \
exit(1); \
} \
\
signal(SIGPIPE, SIG_IGN); \
\
isc_mem_debugging |= ISC_MEM_DEBUGRECORD; \
isc_mem_create(&mctx); \
\
r = cmocka_run_group_tests(tests, setup, teardown); \
\
isc_mem_destroy(&mctx); \
\
return (r); \
#define ISC_TEST_MAIN_CUSTOM(setup, teardown) \
int main(void) { \
int r; \
\
signal(SIGPIPE, SIG_IGN); \
\
isc_mem_debugging |= ISC_MEM_DEBUGRECORD; \
isc_mem_create(&mctx); \
\
r = cmocka_run_group_tests(tests, setup, teardown); \
\
isc_mem_destroy(&mctx); \
\
return (r); \
}